Professor Doolittle is a native of Jonesboro, Georgia. He graduated from Georgia Tech with a bachelor's degree in electrical engineering with highest honors in 1989. He later received his Ph.D. in electrical engineering in 1996 from Georgia Tech. 

His thesis work revolved around identifying the device limiting defects in photovoltaic silicon materials using several custom designed and patented tools. He later worked as a Research Engineer II in the area of compound semiconductor growth with emphasis on wide bandgap semiconductors. He joined the Georgia Tech faculty in 2001. 

During his time at Georgia Tech he has helped develop academic programs in the areas of microelectronic fabrication, materials growth, characterization, and measurement system design. Professor Doolittle consults with industry in the areas of law, materials testing, MBE growth, and test equipment development. 
His hobbies include bible studies, classic cars, playing the guitar, and reading. Most of his free time is spent with his two teenage children.